Identification of major quantitative trait loci for root diameter in
synthetic hexaploid wheat under phosphorus-deficient conditions
Fangkun Wu 1,Xilan Yang 1,Zhiqiang Wang 1,Mei Deng 1,Jian Ma 1,Guoyue Chen 1,Yuming Wei 1,Yaxi Liu1
1.Triticeae Research InstituteSichuan Agricultural UniversityChengduChina
Plant Genetics • Original Paper
First Online: 08 September 2017
Synthetic hexaploid wheat (SHW) possesses numerous genes for resistance
to stress, including phosphorus (P) deficiency. Root diameter (RDM)
plays an important role in P-deficiency tolerance, but information
related to SHW is still limited. Thus, the objective of this study was
to investigate the genetic architecture of RDM in SHW under P-deficient
conditions. To this end, we measured the RDM of 138 F9 recombinant
inbred lines derived from an F2 population of a synthetic hexaploid
wheat line (SHW-L1) and a common wheat line (Chuanmai32) under two P
conditions, P sufficiency (PS) and P deficiency (PD), and mapped
quantitative trait loci (QTL) for RDM using an enriched high-density
genetic map, containing 120,370 single nucleotide polymorphisms, 733
diversity arrays technology markers, and 119 simple sequence repeats. We
identified seven RDM QTL for P-deficiency tolerance that individually
explained 11–14.7% of the phenotypic variation. Five putative candidate
genes involved in root composition, energy supply, and defense response
were predicted. Overall, our results provided essential information for
cloning genes related to P-deficiency tolerance in common wheat that
might help in breeding P-deficiency-tolerant wheat cultivars.
Keywords：Recombinant inbred lines Synthetic hexaploid wheat Quantitative trait locus Phosphorus deficiency Root diameter